To: | Ontology Summit 2013 discussion <ontology-summit@xxxxxxxxxxxxxxxx> |
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From: | Simon Spero <sesuncedu@xxxxxxxxx> |
Date: | Tue, 12 Mar 2013 19:20:21 -0400 |
Message-id: | <CADE8KM6L=OLvbjwHh1PNLdv0v9-GSFoVaWCbwMKmT6OkCPUj2Q@xxxxxxxxxxxxxx> |
On Tue, Mar 12, 2013 at 6:00 PM, Barkmeyer, Edward J <edward.barkmeyer@xxxxxxxx> wrote:
There is an interesting point here, which ties back in in to the summit theme of measurement and evaluation. A sampling of points, without more, can be fitted to a curve using a variety of non parametric techniques, such as splines, or LOESS (locally weighted regression).
There are many different ways of measuring the goodness-of-fit of these curves ( e.g. http://www.itl.nist.gov/div898/handbook/pmd/section4/pmd44.htm ), as well as ways of comparing the goodness of fit of multiple models (AIC, BIC,etc).
There is a big difference between points representing samples taken at random/fixed intervals, and points that are chosen to precisely describe a curve, or that specify the parameters that characterize a function exactly, or to within a known range of precision- for example, being given a sequences of 24-bit samples 48,000Hz that computation suggests approximate a 440Hz sine wave is qualitatively different from from being told that something is an audio recording of a tuning fork, which is different from being told that something is a 440Hz sine wave.
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